Microcrystalline-Silicon-Oxide-Based N-Type Reflector Structure in Micromorph Tandem Solar Cells
Figure 3
Physical properties of n-μc-:H thin films (thickness = 40~50 nm) with R = 8~20 under [H2] = 600 sccm (filled symbols) and 900 sccm (open symbols). (Δ, and ▲: refractive index, ; □, and ■: crystallinity; ∘, and ●: dark conductivity).
