128410.fig.001a
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128410.fig.001b
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128410.fig.001c
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128410.fig.001d
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128410.fig.001e
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128410.fig.001f
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Figure 1: Plots of vacancy concentrations and mass energy losses (LET and NIEL divided by material density) along the depth of a silicon dioxide (SiO2) insulating film. Results were obtained from simulations of 104 proton histories, which included subcascades of recoiling atoms.