[Retracted] Radiation Hardness of Flash Memory Fabricated in Deep-Submicron Technology
Figure 8
Results for the incident beam of 2 MeV: (a) traces of particles (dark traces correspond to alpha particles, while the lighter traces are the path of the displaced ions Si, O, and N), (b) energy density of alpha particles submitted to displaced atoms, and (c) density of vacancy caused by displacement of atoms.
