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International Journal of Photoenergy
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International Journal of Photoenergy
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2013
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Article
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Fig 2
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Research Article
Radiation Damage in Electronic Memory Devices
Figure 2
The average relative change in number of errors in irradiated EEPROM samples (NM93CS46) versus the absorbed dose of radiation: (a) differential; (b) cumulative (
bit,
).
(a)
(b)