Effects of Sulfurization Temperature on Properties of CZTS Films by Vacuum Evaporation and Sulfurization Method

Table 3

The FWHM values and grain sizes of (112) orientation of the CZTS thin films obtained at different sulfurization temperatures.

Sample	S11	S12	S13	S14	S15
𝑇𝑠 (°C)	360	400	450	500	560
FWHM (°)	0.1968	0.1574	0.1378	0.1200	0.1181
Grain size (nm)	39.92	49.91	57.01	65.47	66.52