The Effect of Microcrack Length in Silicon Cells on the Potential Induced Degradation Behavior

Table 1

Electrical performance of five groups of solar cells before and after the PID test.

Sample	PID test	Voc (V)	Isc (A)	FF (%)	Eta (%)	Rsh (Ω)	Irev2 (A)	Degradation
A	Before	0.64	9.511	73.5	18.38	187.78	0.081	2.61%
	After	0.635	9.425	72.8	17.9	11.03	2.057
B	Before	0.64	9.575	73.67	18.55	57.83	0.171	32.02%
	After	0.617	8.675	57.37	12.61	0.44	12.277
C	Before	0.639	9.536	73.58	18.43	57.09	0.4	33.80%
	After	0.576	8.268	62.31	12.2	0.35	12.277
D	Before	0.639	9.502	73.56	18.36	78.94	0.117	37.53%
	After	0.602	8.505	54.49	11.47	0.33	12.277
E	Before	0.64	9.449	73.79	18.33	75.15	0.396	49.32%
	After	0.587	8.28	46.52	9.29	0.21	12.28