Table 2: Overview of SELDI-TOF spectra available as part of the database. Spectra were recorded using low laser energy desorption (m/z range 1500 to 25000) and high laser energy desorption (m/z range 20000 to 150000) from 200 nonredundant samples. Peak clusters common in all spectra of one chip-type were analysed using a 5% signal-to-noise cutoff, and numbers of peaks found in at least 10% or 20% of all spectra were counted.

Chip-typeChip specificityNumber of spectra recorded in the low mass range (1500–25000)Number of spectra recorded in the high mass range (20000–150000)Demographic distribution (number of patient samples analysed which are healthy/cancer pre-op/disease-free cancer post-op)Number of peaks above threshold in all samplesNumber of common peaks above threshold in 10% of all samplesNumber of common peaks above threshold in 20% of all samples

SENDReversed phase636320/43/02182514
NP20None (silicon oxide)21217/14/037116670
HP50Hydrophobicity21217/14/036216885
Q10Anion exchanger636320/43/039312062
CM10Cation exchanger20020093/86/21559202141
IMAC30Metal binding (Cu2+)20020093/86/21587280186