Review Article

Polysilsesquioxanes for Gate-Insulating Materials of Organic Thin-Film Transistors

Table 4

Surface properties of co-PMSQ thin films.

Additive [R-Si(OMe)3]Contact angleSurface free energy
Rmol%(degree)(mJ m−2)

None86.128.2
–(CH2)17CH30.587.128.5
–(CH2)2Ph0.589.627.1
–(CH2)2(CF2)5CF30.592.924.3
–(CH2)2(CF2)5CF31.097.122.3