Editorial Board

Bilal M. Ayyub, University of Maryland, USA
Suk joo Bae
, Hanyang University, Republic of Korea
Satish Bukkapatnam
, Oklahoma State University, USA
Kai Yuan Cai
, Beijing University of Aeronautics and Astronautics, China
Kin P. Cheung
, National Institute of Standards and Technology, USA
Kwai Sang Chin
, City University of Hong Kong, Hong Kong
Ratna Babu Chinnam
, Wayne State University, USA
Tadashi Dohi
, Hiroshima University, Japan
Fausto Fantini
, Università di Modena e Reggio Emilia, Italy
Mircea Grigoriu
, Cornell University, USA
Hongzhong Huang
, University of Electronic Science and Technology of China, China
Shuen L. Jeng
, National Cheng Kung University, Taiwan
Myong-Kee Jeong
, Rutgers, The State University of New Jersey, USA
Don O. Koval
, University of Alberta, Canada
Way Kuo
, University of Tennessee, USA
Xiaohu Li
, Lanzhou University, China
Nikolaos E. Limnios
, Université de Technologie de Compiègne, France
Christian N. Madu
, Pace University, USA
Mohammad Modarres
, University of Maryland, USA
Andrzej S. Nowak
, University of Nebraska–Lincoln, USA
Ajit K. Verma
, Indian Institute of Technology, Bombay, India
Richard C. M. Yam
, City University of Hong Kong, Hong Kong
Shigeru Yamada
, Tottori University, Japan