Editorial Board

Bilal M. Ayyub, University of Maryland, USA
Suk joo Bae, Hanyang University, Republic of Korea
Satish Bukkapatnam, Oklahoma State University, USA
Kai Yuan Cai, Beijing University of Aeronautics and Astronautics, China
Kin P. Cheung, National Institute of Standards and Technology, USA
Kwai Sang Chin, City University of Hong Kong, Hong Kong
Ratna Babu Chinnam, Wayne State University, USA
Tadashi Dohi, Hiroshima University, Japan
Fausto Fantini, Università di Modena e Reggio Emilia, Italy
Mircea Grigoriu, Cornell University, USA
Hongzhong Huang, University of Electronic Science and Technology of China, China
Shuen L. Jeng, National Cheng Kung University, Taiwan
Myong-Kee Jeong, Rutgers, The State University of New Jersey, USA
Don O. Koval, University of Alberta, Canada
Way Kuo, University of Tennessee, USA
Xiaohu Li, Lanzhou University, China
Nikolaos E. Limnios, Université de Technologie de Compiègne, France
Christian N. Madu, Pace University, USA
Mohammad Modarres, University of Maryland, USA
Andrzej S. Nowak, University of Nebraska–Lincoln, USA
Ajit K. Verma, Indian Institute of Technology, Bombay, India
Richard C. M. Yam, City University of Hong Kong, Hong Kong
Shigeru Yamada, Tottori University, Japan