|
| Acronym | Technique | Area overhead | Virtual time overhead | Real time overhead | Real time accuracy | Scalability |
|
| ELA | Embedded logic analyzer [7] | Medium | None | None | Full | Very low |
| SP | Sampling profiling [8, 9] | None | Low-high | Low-high | High-low | High |
| TP | Transparent profiling [10] | Medium | None | None | Full | Low |
| VP | Trace based on virtual prototypes [11] | — | None | High | Very low | Low |
| FS | Functional simulation [15–18] | — | — | Low | Very low | High |
|
| New proposed methods |
| ACI | Automatic compiler instrumentation | None | Low-high | Low-high | High-low | Medium |
| TN | Dedicated tracing node | Low | Low-high | Low-high | High-low | Medium |
| TI | Transparent instrumentation with clock gating | Medium | None | Medium | Medium | Medium |
| CI | Custom instruction and dedicated networks | Medium | Very low | Very low | Very high | High |
|