Raman Spectroscopy for Quantitative Analysis of Point Defects and Defect Clusters in Irradiated Graphite

Figure 1

TEM image of highly oriented pyrolytic graphite (HOPG) irradiated with 20 keV D⁺ at 473 K. The left hand side area (a) of the image is a part of the specimen covered by a mesh wire and the right hand side area (c) is a part irradiated to a dose of 2.5 × 10²¹ ions/m². Selected area diffraction patterns corresponding to the areas (a), (b) and (c) are given below the photograph.