Raman Spectroscopy for Quantitative Analysis of Point Defects and Defect Clusters in Irradiated Graphite
Figure 10
Schematic drawing of the change in peak width of 1580 cm−1 and intensity ratio of on irradiation. Schematic pictures of graphite layers considered from Raman and HRTEM results are shown in the figure. The solid lines can be assigned to the formation of in-plane defects such as vacancies. The upward deviation from the solid line corresponds to the turbulence and disordering of the basal plane. At temperatures lower than 473 K, the upward deviation from the solid line is seen to start at higher values of compared to those above 573 K, as shown by the dotted lines. This is probably due to the less annihilation of in-plane defects with mobile interstitials.
