Raman Spectroscopy for Quantitative Analysis of Point Defects and Defect Clusters in Irradiated Graphite

<table>Changes in Raman spectra for HOPG foils irradiated with 25 keV He<sup>+</sup> at three different temperatures of RT, 673, and 973 K. The appearance of the TEM diffraction pattern of the foils is denoted by<i> s </i>(spot), <i>hs</i> (halo and spot), and <i>h</i> (halo).</table>

International Journal of Spectroscopy

fig3

Figure 3

Figure 3: Raman Spectroscopy for Quantitative Analysis of Point Defects and Defect Clusters in Irradiated Graphite 