Raman Spectroscopy for Quantitative Analysis of Point Defects and Defect Clusters in Irradiated Graphite

<table>Changes in Raman spectra on isochronally annealing in steps of 100 K/1800 s for HOPG foils irradiated with 25 keV D<sup>+</sup> at RT to three different doses. The appearance of the TEM diffraction patterns of the foils before the annealing is denoted by<i> s </i>(spot),<i> hs</i> (halo and spot),  and <i>h</i> (halo).</table>

International Journal of Spectroscopy

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Figure 7

Figure 7: Raman Spectroscopy for Quantitative Analysis of Point Defects and Defect Clusters in Irradiated Graphite 