521701.fig.001a
(a)
521701.fig.001b
(b)
521701.fig.001c
(c)
521701.fig.001d
(d)
Figure 1: FESEM pictures for four representative GaN films deposited at : (a) 473 K, (b) 673 K (inset shows the variation of grain size with substrate temperature), (c) 723 K (inset shows the corresponding XRD trace), and (d) 873 K (inset shows the corresponding grain size distribution).