Table 2: X-ray diffraction analysis of the SnO2 thin films.

(h k l) planesAngle, 2 𝜃 (degree)d spacing (Å)FWHMCrystallite size (nm)

(1 1 0)26.603.34840.16334
(1 0 1)33.903.64220.17133
(2 0 0)38.002.36600.19032
(1 1 1)39.002.30760.18230
(2 1 0)42.602.12060.13028
(2 1 1)51.801.76350.15932
(2 2 0)54.801.67380.18530
(0 0 2)57.801.59390.12629
(3 1 0)61.901.49780.15030
(1 1 2)64.801.43760.22326
(3 0 1)66.001.41430.17430
(2 0 2)71.301.32160.16828
(3 2 1)78.701.21490.13227