Ambient Zinc K-Edge Extended X-Ray Absorption Fine Structure Studies on Solid Solution Hardening of the Ternary Alloys
Figure 4
(a) Fourier transformed EXAFS plots of Zn K-edge EXAFS absorption data for a binary sample of ZnSe and ternary samples of Zn1−xBexSe from A to E plotted in the real space and corresponding to the real part of oscillations Re[χ(r)] from the first two shell contributions. (b) EXAFS plots are shown in FT real space, corresponding to the imaginary part of oscillations Im [χ(r)] from the first two shell contributions for the various corresponding compositions. (c) Magnitude profile of the Zn K-edge EXAFS absorption data for samples A−E is plotted in the real-space corresponding to the combined envelop overlap of the real and the imaginary parts. The function Mag[χ(r)] roughly corresponds to the shape of the amplitude function A(r) and can be produced by FT magnitude filtering of the Zn K-edge Zn1−xBexSe for samples A to E. A dotted box indicates the approximate position of the envelop/window over the R magnitude that is used for back FT for the first shell.
