Research Article

Structural and Optical Properties of Aluminum Nitride Thin Films Deposited by Pulsed DC Magnetron Sputtering

Figure 3

AFM micrographs of AlN film deposited for (a) 30, (b) 50, and (c) 80% flow ratio of nitrogen/argon.
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(a)
759462.fig.003b
(b)
759462.fig.003c
(c)