Internal Due Date Assignment in a Wafer Fabrication Factory by an Effective Fuzzy-Neural Approach

Table 1

The differences between this study and some recent references.

Method	Data preprocessing method	Forecasting method	Upper bound	Optimization method	Computation complexity
Chen et al. (2008) [1]	SOM	FBPN	Yes	Simulation + fuzzy rules	High
Chien et al. (2011) [4]	No	Nonlinear regression	No	BPN	Low
Chen and Lin (2011) [16]	FCM	BPN	Yes	NLP	Very high
Chen and Wang (2013) [23]	PCA + FCM	BPN	No	An iterative process to reduce outliers	Low
The proposed methodology	PCA + FCM	BPN	Yes	IUBR	Low

NLP: nonlinear programming.