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Journal of Atomic, Molecular, and Optical Physics
Volume 2011 (2011), Article ID 295304, 6 pages
http://dx.doi.org/10.1155/2011/295304
Research Article

Aging of Oxygen-Treated Trimethylsilane Plasma-Polymerized Films Using Spectroscopic Ellipsometry

1Physics Department, Islamic University of Gaza, P.O. Box 108, Gaza, Palestine
2Physics Department, University of Missouri-Kansas City, Kansas City, MO 64110, USA

Received 6 June 2011; Accepted 2 August 2011

Academic Editor: Edward E. Eyler

Copyright © 2011 Taher M. El-Agez et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Citations to this Article [5 citations]

The following is the list of published articles that have cited the current article.

  • Sofyan A. Taya, and Taher M. El-Agez, “Effect of noise on the optical parameters extracted from different ellipsometric configurations,” Physica Scripta, vol. 85, no. 4, 2012. View at Publisher · View at Google Scholar
  • Taher M. El-Agez, and Anas A. Alkanoo, “Rotating polarizer, compensator, and analyzer ellipsometry,” Chinese Physics B, vol. 22, no. 12, 2013. View at Publisher · View at Google Scholar
  • Mustafa H. Abu Nasr, and Taher M. El-Agez, “Reflection, transmission and ellipsometric parameters of the multilayer structure using a bi-characteristic-impedance transmission line approach,” Optica Applicata, vol. 43, no. 4, pp. 817–829, 2013. View at Publisher · View at Google Scholar
  • Taher M. El-Agez, “Rotating polarizer analyzer ellipsometer with a fixed compensator,” Optik, vol. 124, no. 18, pp. 3379–3383, 2013. View at Publisher · View at Google Scholar
  • Taher M. El-Agez, and Sofyan A. Taya, “Design of a spectroscopic ellipsometer by synchronous rotation of the polarizer and analyzer in opposite directions,” Microwave and Optical Technology Letters, vol. 56, no. 12, pp. 2822–2826, 2014. View at Publisher · View at Google Scholar