Optical Response Near the Soft X-Ray Absorption Edges and Structural Studies of Low Optical Contrast System Using Soft X-Ray Resonant Reflectivity

<table>Simulated reflectivity profile at 187.5 eV for 60 nm B<sub>4</sub>C thin film with a low density B<sub>4</sub>C layer of 1.3 nm (a) depth sensitivity with porosity 35%. (b) Sensitivity to porosity.</table>

Journal of Atomic and Molecular Physics

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Figure 14

Figure 14: Optical Response Near the Soft X-Ray Absorption Edges and Structural Studies of Low Optical Contrast System Using Soft X-Ray Resonant Reflectivity 

Figure 14 | Optical Response Near the Soft X-Ray Absorption Edges and Structural Studies of Low Optical Contrast System Using Soft X-Ray Resonant Reflectivity 