Optical Response Near the Soft X-Ray Absorption Edges and Structural Studies of Low Optical Contrast System Using Soft X-Ray Resonant Reflectivity

<table>Simulated reflectivity profile at 187.5 eV for B<sub>4</sub>C (60 nm)-on-Fe (18 nm) bilayer, with porous B<sub>4</sub>C layer. The thickness of porous layer is 1.3 nm with porosity 35%.</table>

Journal of Atomic and Molecular Physics

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Figure 15

Figure 15: Optical Response Near the Soft X-Ray Absorption Edges and Structural Studies of Low Optical Contrast System Using Soft X-Ray Resonant Reflectivity 

Figure 15 | Optical Response Near the Soft X-Ray Absorption Edges and Structural Studies of Low Optical Contrast System Using Soft X-Ray Resonant Reflectivity 