Optical Response Near the Soft X-Ray Absorption Edges and Structural Studies of Low Optical Contrast System Using Soft X-Ray Resonant Reflectivity

<table>XRR spectrum of BN thin film (21.7 nm) at 8047 eV. In the inset, the continuous line shows EDP profile of the thin film and the dotted line shows bulk values.</table>

Journal of Atomic and Molecular Physics

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Figure 18

Figure 18: Optical Response Near the Soft X-Ray Absorption Edges and Structural Studies of Low Optical Contrast System Using Soft X-Ray Resonant Reflectivity 

Figure 18 | Optical Response Near the Soft X-Ray Absorption Edges and Structural Studies of Low Optical Contrast System Using Soft X-Ray Resonant Reflectivity 