Optical Response Near the Soft X-Ray Absorption Edges and Structural Studies of Low Optical Contrast System Using Soft X-Ray Resonant Reflectivity

<table>Measured SXRR profiles of BN thin film (21 nm) near boron K-edge is fitted with different model. The best fit is obtained for trilayer model. The inset shows the best fit model.</table>

Journal of Atomic and Molecular Physics

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Figure 21

Figure 21: Optical Response Near the Soft X-Ray Absorption Edges and Structural Studies of Low Optical Contrast System Using Soft X-Ray Resonant Reflectivity 

Figure 21 | Optical Response Near the Soft X-Ray Absorption Edges and Structural Studies of Low Optical Contrast System Using Soft X-Ray Resonant Reflectivity 