Research Article

Hydrogenated Silicon Carbide Thin Films Prepared with High Deposition Rate by Hot Wire Chemical Vapor Deposition Method

Figure 4

Variation of (a) Si–C bond density, (b) Si–H bond density, (c) C–H bond density, and (d) total hydrogen content (CH) as a function of deposition pressure for SiC:H films deposited by HW-CVD method.
905903.fig.004a
(a)
905903.fig.004b
(b)
905903.fig.004c
(c)
905903.fig.004d
(d)