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Journal of Electrical and Computer Engineering
Volume 2012 (2012), Article ID 282589, 9 pages
http://dx.doi.org/10.1155/2012/282589
Research Article

Measuring Biometric Sample Quality in terms of Biometric Feature Information in Iris Images

Department of Systems and Computer Engineering, Carleton University, Ottawa, ON, Canada K1S 5B6

Received 5 February 2012; Revised 21 May 2012; Accepted 22 May 2012

Academic Editor: Weiyao Lin

Copyright © 2012 R. Youmaran and A. Adler. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

R. Youmaran and A. Adler, “Measuring Biometric Sample Quality in terms of Biometric Feature Information in Iris Images,” Journal of Electrical and Computer Engineering, vol. 2012, Article ID 282589, 9 pages, 2012. doi:10.1155/2012/282589