Novel Complete Probabilistic Models of Random Variation in High Frequency Performance of Nanoscale MOSFET

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</svg> [<a href="/journals/jece/2013/189436/#B18">18</a>].</table>

Journal of Electrical and Computer Engineering

fig1

Figure 1

Figure 1: Novel Complete Probabilistic Models of Random Variation in High Frequency Performance of Nanoscale MOSFET 