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Journal of Electrical and Computer Engineering
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Journal of Electrical and Computer Engineering
/
2015
/
Article
/
Tab 2
/
Research Article
Robust Abnormal Event Recognition via Motion and Shape Analysis at ATM Installations
Table 2
Testing data set.
Number of MHI frames
5
10
15
Single
270
135
89
Multiple
110
55
36
Multiple abnormal
340
169
113
Total
720
359
238