Test Generation for Embedded Software and Systems

Call for Papers

In today's world, embedded software and systems are becoming prevalent and essential to an increasingly wide range of applications such as avionics, automotive, medical devices, industrial automation, smart phones, smart appliances, and communication systems. Driven by the need for rapid access to information, such embedded software and systems have to satisfy a number of competing design requirements concerning the performance, power, reliability, security, and usability. Even with relatively limited computing resources, such as CPU, memory, and disk space, these systems and software have managed to become increasingly more intelligent and capable of delivering more services seamlessly. However, the drastic increase in system complexity also brings challenging new problems for testing and verification. In particular, traditional testing and verification techniques can no longer keep up with the pace of development and cope with the constantly changing user expectations and myriad of evolving usage scenarios. This special issue aims to publish original contributions. Potential topics include, but are not limited to:

• Methods for overcoming the aforementioned difficulty in testing and validation of embedded software and systems
• Automated test generation techniques based on high-level abstraction, formal methods, semiformal methods, and static/dynamic/hybrid analysis methods
• The expected usage patterns and models of potential software vulnerabilities
• The scalability and practical feasibility of the proposed approaches

Before submission authors should carefully read over the journal's Author Guidelines, which are located at http://www.hindawi.com/journals/jece/guidelines/. Prospective authors should submit an electronic copy of their complete manuscript through the journal Manuscript Tracking System at http://mts.hindawi.com/submit/journals/jece/circuits.systems/ess/ according to the following timetable:

Lead Guest Editor

• Malay Ganai, NEC Labs America, 4 Independence Way, Princeton, NJ 08540, USA

Guest Editors

• Chao Wang, Department of Electrical and Computer Engineering, Virginia Polytechnic Institute and State University (Virginia Tech), Blacksburg, VA 24046, USA
• Chung-Yang (Ric) Huang, Department of Electrical Engineering, National Taiwan University, Taipei, Taiwan