Review Article

Surface Modification and Alloying of Aluminum and Titanium Alloys with Low-Energy, High-Current Electron Beams

Figure 14

TEM image of a multilayer (Al/C/Al/C) system on an Al substrate after pulsed melting of Al layers: (a) bright-field image, (b, c) diffraction patterns for bottom and top parts of (a), respectively, (2.5 μs, 1.8 J/cm2, ).
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