Journals
Publish with us
Publishing partnerships
About us
Blog
Journal of Materials
Table of Contents
Journal of Materials
/
2013
/
Article
/
Fig 2
/
Review Article
Recent Developments in the X-Ray Reflectivity Analysis for Rough Surfaces and Interfaces of Multilayered Thin Film Materials
Figure 2
Measured X-ray reflectivity from a silicon wafer covered with a thin (48 nm) GaAs layer.