Investigations of Different Phases Responsible for Changes in Optical Properties of Organic Semiconducting Device Material Thin Films

<table>X-ray diffraction data on Znq<sub>2</sub> samples before (Znq<sub>2</sub><svg height="5.4499998" id="M3" style="vertical-align:-0.0pt" version="1.1" viewbox="0 0 4 5.4499998" width="4" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink">
<g transform="matrix(.017,-0,0,-.017,.062,5.388)"><path d="M170 255q0 -25 -16 -41t-40 -16t-40 16t-16 41t16 41.5t40 16.5t40 -16.5t16 -41.5z" id="x22C5"></path></g>
</svg>2H<sub>2</sub>O) and after sublimation ((Znq<sub>2</sub>)<sub>4</sub>). </table>

Journal of Materials

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Figure 1

Figure 1: Investigations of Different Phases Responsible for Changes in Optical Properties of Organic Semiconducting Device Material Thin Films 