On the Fluctuation Induced Excess Conductivity in Stainless Steel Sheathed MgB₂ Tapes

Table 1

Summary of the results obtained from fitting the resistivity data with AL and LD models with the normal state was fitted to 𝜌_𝑛(𝑇)=𝑎+𝑏𝑇^𝑐.

Criterion for 𝑇C^mf	𝑇C^mf	Fitting model	𝑑 or 𝑠(Å)	ξ(0) (Å)	msd (𝜎𝑆) (Ωm)^2
From linear extrapolation of Δ𝜎=0	40.889 K	AL-2D	29.70	—	2.1×10^−12
		AL-3D	—	23.40	8.2×10^−14
		LD-Layered	40.87	35.3	1.3×10^−13
Peak in 𝑑𝜌/𝑑𝑇 versus 𝑇 curve	40.901 K	AL-2D	30.76	—	2.1×10^−12
		AL-3D	—	21.05	6.1×10^−14
		LD-Layered	35.20	31.99	8.5×10^−14