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Journal of Materials
Table of Contents
Journal of Materials
/
2015
/
Article
/
Tab 2
/
Research Article
Rutherford Backscattering Spectrometry Analysis and Structural Properties of
Thin Films Deposited by Chemical Spray Pyrolysis
Table 2
Elemental compositions and thickness profiles of
thin films.
Sample code
Compositions (%)
RBS thickness (10
15
atoms/cm)
Linear thickness (nm)
Zn
Pb
S
ZPS1
—
40.58
59.42
155.220
81
ZPS2
1.65
47.37
50.98
156.147
82
ZPS3
3.15
45.83
51.02
156.121
82
ZPS4
4.84
44.57
50.59
156.318
82
ZPS5
7.45
42.30
50.25
157.452
82
ZPS6
8.84
40.82
50.34
172.465
90