Table 1:
Ellipsometric data of
n
,
k
, and
d
for the thin films of ZnO.
Substrate
Refractive index (
𝑛
)
Extinction coefficient (
𝑘
)
Film thickness (
𝑑
)
Silicon
1.41 ± 0.01
0.005 ± 0.001
585 ± 0.5 nm
1.41 ± 0.01
0.005 ± 0.001
582 ± 0.7 nm
Quartz
2.405 ± 0.004
0.002 ± 0.001
104 ± 0.5 nm