Si Incorporation in InP Nanowires Grown by Au-Assisted Molecular Beam Epitaxy
Figure 3
(a) TEM image for zone axis of Si-doped InP NWs; (b) high magnification bright field STEM image; (c) STEM HAADF image of the same zone as (b). Black arrows in (b) and (c) indicate the position of stacking faults.