Research Article

Fabrication of Lateral Polysilicon Gap of Less than 50 nm Using Conventional Lithography

Figure 6

The thickness of oxide layer (a) and gap size (b) as a function of the 7th-cycle oxidation time. The relationship of gap size and oxidation thickness is shown in (c).
250350.fig.006a
(a)
250350.fig.006b
(b)
250350.fig.006c
(c)