Research Article

GISAXS View of Induced Morphological Changes in Nanostructured CeVO4 Thin Films

Figure 1

The geometry of GISAXS measurements. is the wave vector of the incident X-ray beam, is the wave vector of the outgoing X-ray beam, and q is the scattering wave vector, with the components, and . The unit vector n is normal to the sample surface. The wave vector is in the direction of the specular reflection.
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