Electronic Structure of BiFe1−xMnxO3 Thin Films Investigated by X-Ray Absorption Spectroscopy
Figure 1
X-ray diffraction (XRD) patterns of BiFe1-x MnxO3 () films on Pt(111)/Ti/SiO2/Si(100) substrate: (a) 2 from 10 to 60; (b) enlarged 2 of (100) from 20 to 24.