Research Article

Electronic Structure of BiFe1−xMnxO3 Thin Films Investigated by X-Ray Absorption Spectroscopy

Figure 1

X-ray diffraction (XRD) patterns of BiFe1-x MnxO3 ( 𝑥 = 0 , 0 . 1 , 0 . 2 , 0 . 3 ) films on Pt(111)/Ti/SiO2/Si(100) substrate: (a) 2 𝜃 from 10 to 60; (b) enlarged 2 𝜃 of (100) from 20 to 24.
123438.fig.001a
(a)
123438.fig.001b
(b)