Electrical Crystallization Mechanism and Interface Characteristics of Nanowire ZnO/Al Structures Fabricated by the Solution Method

<table>(a) Voltage (<svg height="10.575" id="M6" style="vertical-align:-0.20064pt" version="1.1" viewbox="0 0 12.625 10.575" width="12.625" xmlns="http://www.w3.org/2000/svg">
<g transform="matrix(1.25,0,0,-1.25,0,10.575)">
<g transform="translate(72,-63.54)">
<text transform="matrix(1,0,0,-1,-71.95,63.79)">
<tspan style="font-size: 12.50px; " x="0" y="0">𝑉</tspan>
</text>
</g>
</g>
</svg>-) current (<svg height="10.325" id="M7" style="vertical-align:-0.0pt" version="1.1" viewbox="0 0 9.0375004 10.325" width="9.0375004" xmlns="http://www.w3.org/2000/svg">
<g transform="matrix(1.25,0,0,-1.25,0,10.325)">
<g transform="translate(72,-63.74)">
<text transform="matrix(1,0,0,-1,-71.95,63.79)">
<tspan style="font-size: 12.50px; " x="0" y="0">𝐼</tspan>
</text>
</g>
</g>
</svg>) curve of structures and (b) surface temperature curve of thermal induced at 3.75 V for 10 mins.</table>

Journal of Nanomaterials

fig4

Figure 4

Figure 4: Electrical Crystallization Mechanism and Interface Characteristics of Nanowire ZnO/Al Structures Fabricated by the Solution Method 