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Journal of Nanomaterials
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Journal of Nanomaterials
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2012
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Article
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Fig 5
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Research Article
Optical and Structural Properties of Silicon Nanocrystals Embedded in SiO
x
Matrix Obtained by HWCVD
Figure 5
PL of
S
i
O
𝑥
films grown at (a) 800°C, (b) 900°C, and (c) 1000°C.
(a)
(b)
(c)