Research Article

Optical and Structural Properties of Silicon Nanocrystals Embedded in SiOx Matrix Obtained by HWCVD

Table 2

Composition data of the silicon oxide phase by FTIR and composition data of the whole film found by EDAX.

Growth temperature (°C)Composition by EDAXComposition of S i O 𝑥 phase by FTIRCoefficient
xx 𝑎 𝑏

8001.21.820.340.65
9001.111.960.430.56
10000.7220.640.36