Orientation of One-Dimensional Silicon Polymer Films Studied by X-Ray Absorption Spectroscopy
Figure 1
XPS wide scan spectra for the PDMS films with different thickness evaporated on HOPG surface at ambient temperature. The sample surface was irradiated with the SR beam of 2.2 keV photons as an excitation source. The spectra were taken at the step energy of 1.0 eV. The relationship between the film thickness and the intensity ratio of Si 1s/C 1s calculated by (1) is (a).
