Research Article

On the Origin of Light Emission in Silicon Rich Oxide Obtained by Low-Pressure Chemical Vapor Deposition

Figure 3

AFM images of SRO10 (a) as-deposited and (b) after annealing at 1,100°C for 180 minutes (Ro10 A), and (c) comparison of profiles along the lines in the images.
890701.fig.003a
(a)
890701.fig.003b
(b)
890701.fig.003c
(c)