Thermal Stability of Neodymium Aluminates High-κ Dielectric Deposited by Liquid Injection MOCVD Using Single-Source Heterometallic Alkoxide Precursors
Figure 4
Leakage current density () versus electric field (Eox) applied across the NdAlOx/SiO2 stacks as a function of PDA temperatures. The NdAlOx films thickness was ~ 10.4 to 11 nm.