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Journal of Nanomaterials
Volume 2013 (2013), Article ID 195325, 17 pages
http://dx.doi.org/10.1155/2013/195325
Review Article

Technical Solutions to Mitigate Reliability Challenges due to Technology Scaling of Charge Storage NVM

Faculty of Engineering, Multimedia University, Persiaran Multimedia, 63100 Cyberjaya, Selangor, Malaysia

Received 30 April 2013; Accepted 11 July 2013

Academic Editor: Ugur Serincan

Copyright © 2013 Meng Chuan Lee and Hin Yong Wong. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Meng Chuan Lee and Hin Yong Wong, “Technical Solutions to Mitigate Reliability Challenges due to Technology Scaling of Charge Storage NVM,” Journal of Nanomaterials, vol. 2013, Article ID 195325, 17 pages, 2013. doi:10.1155/2013/195325