Technical Solutions to Mitigate Reliability Challenges due to Technology Scaling of Charge Storage NVM

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</svg> measurement of PCM cell in amorphous and crystalline phases [<a href="/journals/jnm/2013/195325/#B94">21</a>].</table>

Journal of Nanomaterials

fig15

Figure 15

Figure 15: Technical Solutions to Mitigate Reliability Challenges due to Technology Scaling of Charge Storage NVM 