Annealing Effect on the Thermoelectric Properties of Bi<sub>2</sub>Te<sub>3</sub> Thin Films Prepared by Thermal Evaporation Method

<table>XRD patterns of the Bi<sub>2</sub>Te<sub>3</sub> thin film deposited at the substrate temperature of 150°C.</table>

Journal of Nanomaterials

Figure 1: Annealing Effect on the Thermoelectric Properties of Bi<sub>2</sub>Te<sub>3</sub> Thin Films Prepared by Thermal Evaporation Method 