Low-Temperature Annealing Induced Amorphization in Nanocrystalline NiW Alloy Films
Figure 2
Cross-sectional bright field TEM micrographs of (a) as-deposited NiW alloy, (b) , and (c) . The red arrows shown in (a) to (c) denote crystal growth direction in the films. (d), (e), and (f) are dark field TEM micrographs corresponding to (a), (b), and (c), respectively. HRTEM images of the region indexed by a circle in (a), (b), and (c) are represented separately in (g), (h), and (i).
