Nanolayered Diamond Sintered Compact Obtained by Direct Conversion from Highly Oriented Graphite under High Pressure and High Temperature
Figure 1
A bright field TEM image of HOPG starting material and the corresponding SAED pattern. It consists of layered crystals of ~20–200 nm thick which show a strong preferred orientation along the stacking direction. The orientation along the lateral direction is not uniform and varies layer by layer, as indicated by diffraction contrast.
